A sharper look at the interior of semiconductors
A research team has developed a high-resolution imaging method based on extreme short-wave UV light. It can be used to examine internal structures in semiconductors non-destructively, and with nanometer precision.
from Latest Science News -- ScienceDaily https://ift.tt/3qrwnZn
from Latest Science News -- ScienceDaily https://ift.tt/3qrwnZn
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