Developing new techniques to improve atomic force microscopy
Researchers at the Beckman Institute for Advanced Science and Technology have developed a new method to improve the detection ability of nanoscale chemical imaging using atomic force microscopy. These improvements reduce the noise that is associated with the microscope, increasing the precision and range of samples that can be studied.
from Phys.org - latest science and technology news stories https://ift.tt/3830Swi
from Phys.org - latest science and technology news stories https://ift.tt/3830Swi
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