Method detects defects in 2-D materials for future electronics, sensors

To further shrink electronic devices and to lower energy consumption, the semiconductor industry is interested in using 2-D materials, but manufacturers need a quick and accurate method for detecting defects in these materials to determine if the material is suitable for device manufacture. Now a team of researchers has developed a technique to quickly and sensitively characterize defects in 2-D materials.

from Phys.org - latest science and technology news stories https://ift.tt/37KbSh6

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